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Applicant:
Indian Institute of Technology (IIT) Patna 
Author:
S. Kumar, M. K. Manglam, S. Supriya, H. K. Satyapal, R. K Singh and M. Kar 
Corresponding Authors:
Manoranjan Kar 
DOI #:
Doi https://doi.org/10.1016/j.jmmm.2018.10.085 
Title:
Lattice strain mediated dielectric and magnetic properties in La doped barium hexaferrite 
Journal:
Journal of Magnetism and Magnetic Materials 
Year:
2019 
Volume:
473 
Page:
312-319 
Keywords:
XRD, Dielectric constant, Lattice strain, LA to saturation method, Magnetocrystalline anisotropy 
Abstract:
The lanthanum (La3+) doped M-type barium hexaferrite (Ba1−xLaxFe12O19) with x = 0.0, 0.05, 0.10, 0.15, and 0.20 have been prepared by the sol-gel technique. The Rietveld refinement of X-ray diffraction (XRD) patterns reveals the crystallization of all the samples to hexagonal crystal symmetry with P63/mmc space group. Investigation of Raman spectra strongly supports the XRD pattern analysis. The average grain (particle) size is found to be above 300 nm. Both the saturation magnetization and magnetocrystalline anisotropy have been estimated by employing the “Law of Approach (LA) to Saturation magnetization”. Both the above parameters are found to be maximum for 10% La doped BaFe12O19. It could be due to the lattice strain mediated magnetism in barium hexaferrite. However, these magnetic parameters decrease with the increase in La doping beyond 10% (> x = 0.10) in barium hexaferrite. The dielectric permittivity gradually increases with the La concentration in the BHF. A correlation between dielectric constant with the lattice strain has been reported in La3+ doped barium hexaferrite. 
Entered by:
Venkata Dantham on 2020-08-02 
 
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