Indian Science Technology and Engineering facilities Map
 
Supplier Map
Service Map

Publications

Publication Details

Applicant:
Indian Institute of Technology (IIT) Patna 
Author:
Prajapati, D., K., and Tiwari, M. 
Corresponding Authors:
Mayank Tiwari 
DOI #:
https://doi.org/10.1115/1.4034960 
Title:
Topography Analysis of Random Anisotropic Gaussian Rough Surfaces 
Journal:
ASME Journal of Tribology  
Year:
2017 
Volume:
139 
Page:
041402 
Keywords:
Contact mechanics, Surface properties , Characterization 
Abstract:
Engineered surfaces (ground and similarly structured rough surfaces) show anisotropic characteristics and their topography parameters are direction dependent. Statistical characterization of these surfaces is still complex because of directional nature of surfaces. In this technical brief, an attempt is made to simulate anisotropic surfaces through use of topography parameters (three-dimensional (3D) surface parameters). First, 3D anisotropic random Gaussian rough surface is generated numerically with fast Fourier transform (FFT). Numerically generated anisotropic random Gaussian rough surface shows statistical properties (texture direction, texture ratio) similar to ground and similarly directional anisotropic rough surfaces. For numerically generated anisotropic Gaussian rough surface, important 3D roughness parameters are determined. Sayles and Thomas' (1976, "Thermal Conductance of Rough Elastic Contact," Appl. Energy, 2(4), pp. 249-267.) theoretical model for directional anisotropic rough surface is adopted here for calculating the summit parameters, i.e., equivalent bandwidth parameter, mean summit curvature, skewness of summit height, standard deviation of summit height, and equivalent spectral moments. This work demonstrates the variation of spectral moments in both across and parallel to the lay directions with pattern ratio (γ=βx/βy). Correlation length (βx) is fixed 10μm and correlation length (βy) is varied from 100 to 10 μm. Variation of summit parameters with pattern ratio is also discussed in detail. Results shows that mean summit curvature and skewness of summit heights increase with increase in pattern ratio, whereas standard deviation of summit heights and equivalent bandwidth parameter (αe) decreases with pattern ratio. A significant difference is found in "Abbott-Firestone" parameters when calculated in both perpendicular and parallel to lay directions. Effect of these parameters on wear process is discussed in brief. 
Entered by:
Physics Head on 2020-08-04 
 
THE VISION
THE MISSION
ABOUT I-STEM
It has always been the basic tenet of the Government of India, in generously funding R&D efforts at academic institutions over the years, that facilities established through such support be made available to those needing them and qualified to make use of them for their own research work
read more >>

However, this was never easy or straightforward for, among other reasons, there was no ready source of information of what facility was available and where. Thanks to the Web, it is much easier today to have a national and regional “inventory of resources”, so as to match users with the resources they need, and to do all this in an efficient and transparent manner.

This can lead to a leap in R&D productivity and greatly enhance the effectiveness of public investment. This is the motivation behind I-STEM.
read less <<
Visitor Hit Counter
Hosted at Indian Institute of Science
Copyright © 2024 I-STEM. All rights reserved.
Audited by: STQC Bengaluru.