Equipment Info

Field Emission Scanning Electron Microscope with EDS

Equipment Info

Equipment Code : 3236741

Make : TESCAN

Model : MAIA3 XMH

Institution : Sophisticated Analytical Instrument Facilities (SAIF) MGU Kottayam

Department : SAIF MGU Kottayam

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used. Energy Dispersive Spectroscopy (EDS) can be used to determine which chemical elements are present in a sample.

Usage Rate: (as indicated by the custodian/host institution)

Samples	External Academic User	Internal Academic User	Industry User	Start-ups	National Research Lab User	Grassroot innovator
FE-SEM IMAGING
EDS/MAPPING
EDS+MAPPING
FESEM + EDS/MAPPING
FESEM+EDS+MAPPING

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
support@istem.co.in

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Field Emission Scanning Electron Microscope with EDS

Equipment Info

Equipment Code : 3236741

Make : TESCAN

Model : MAIA3 XMH

Institution : Sophisticated Analytical Instrument Facilities (SAIF) MGU Kottayam

Department : SAIF MGU Kottayam

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Field Emission Scanning Electron Microscope with EDS

Equipment Info

Equipment Code : 3236741

Make : TESCAN

Model : MAIA3 XMH

Institution : Sophisticated Analytical Instrument Facilities (SAIF) MGU Kottayam

Department : SAIF MGU Kottayam

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources