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Field emission scanning electron microscopy (FESEM)
Equipment Code : 3236741
Make : TESCAN
Model : MAIA3 XMH
Institution : Sophisticated Analytical Instrument Facilities (SAIF) MGU Kottayam
Department : SAIF MGU Kottayam
Funding Agency Details :
Pooling of Equipment slot : No
Last AMC Done :
Description : Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used
(Internal but different department/lab)
i) Academic (External) means researchers belongs to the other institution.
ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.
iii) Academic (Internal) means researchers belongs to the same institution.
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