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Equipment Information
Scanning Electron Microscope (SEM) with EDS
SAIFKOCHI
SAIF
Sophisticated Test and Instrumentation Centre (STIC) Cochin
No
3233803
Accelerating voltage : 0.5 to 30 kV, Filament: Tungsten Magnification x 300000 , EDAX resolution 136 eV, EDAX detector area 30 mm2, Elemental Mapping
SEMEDS
SAIF Kochi
Jeol Limited Japan
6390LA
MD14410049
Characterization
DST
External Funding
Jeol India Limited
js@jeolindia.com
Jeol india limited
ajp@jeolindia.com
www.sticindia.com

Last AMC Done:
No
saif@sticindia.com

  UP

Custodian of the equipment may apply for Catalytic Grant/Funding for maintenance , repairing , upgradation if they have procured this equipment from the funding supported by DST GoI.

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THE VISION
THE MISSION
ABOUT I-STEM
It has always been the basic tenet of the Government of India, in generously funding R&D efforts at academic institutions over the years, that facilities established through such support be made available to those needing them and qualified to make use of them for their own research work
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However, this was never easy or straightforward for, among other reasons, there was no ready source of information of what facility was available and where. Thanks to the Web, it is much easier today to have a national and regional “inventory of resources”, so as to match users with the resources they need, and to do all this in an efficient and transparent manner.

This can lead to a leap in R&D productivity and greatly enhance the effectiveness of public investment. This is the motivation behind I-STEM.
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