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Equipment Information
Scanning Electron Microscope (SEM) with EDS
SAIFKOCHI
SAIF
Sophisticated Test and Instrumentation Centre (STIC) Cochin
No
3233803
Accelerating voltage : 0.5 to 30 kV, Filament: Tungsten Magnification x 300000 , EDAX resolution 136 eV, EDAX detector area 30 mm2, Elemental Mapping
SEMEDS
SAIF Kochi
Jeol Limited Japan
6390LA
MD14410049
Characterization
DST, Govt. of India
External Funding
Jeol India Limited
js@jeolindia.com
Jeol india limited
ajp@jeolindia.com
www.sticindia.com

Last AMC Done:
No
saif@sticindia.com

  UP

Custodian of the equipment may apply for Catalytic Grant/Funding for maintenance , repairing , upgradation if they have procured this equipment from the funding supported by DST GoI.

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