Equipment Info

Field Emission Scanning Electron Microscope

Equipment Info

Equipment Code : 232910

Make : FEI USA

Model : Nova Nano SEM 450

Institution : Indian Institute of Technology (IIT) Mandi

Department : Advanced Materials Research Centre

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

1 / 1

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PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Field Emission Scanning Electron Microscope is an advanced microscope that provides high-resolution, detailed images of sample surfaces by scanning them with a focused electron beam generated from a field emission source. Sample Requirements: Powder/Solid samples (Dry and vacuum compatible sample) Accelerating voltage – 500v-30 kV Electron Source- FEG with ultra-high brightness Schottky field emitter Resolution- 1.5 nm Magnification range- 30X-100KX Detectors-EDS, EBSD, BSD, LVD

Usage Rate: (as indicated by the custodian/host institution)

Samples	External Academic User	Internal Academic User	Industry User	Start-ups	National Research Lab User	Grassroot innovator
FESEM
FESEM-EDX/Mapping

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
support@istem.co.in

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Field Emission Scanning Electron Microscope

Equipment Info

Equipment Code : 232910

Make : FEI USA

Model : Nova Nano SEM 450

Institution : Indian Institute of Technology (IIT) Mandi

Department : Advanced Materials Research Centre

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Field Emission Scanning Electron Microscope

Equipment Info

Equipment Code : 232910

Make : FEI USA

Model : Nova Nano SEM 450

Institution : Indian Institute of Technology (IIT) Mandi

Department : Advanced Materials Research Centre

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources