Enter the captcha to process the search!
Equipment Info
Focused Ion Beam Scanning Electron Microscope (FIBSEM)
Equipment Code : 2736841
Make : Thermo Fisher Scientific
Model : HELIOS 5 UC
Institution : Sophisticated Analytical Instrument Facilities (SAIF) IIT Bombay
Department : SAIF
Funding Agency Details : DST, Govt. of India
Pooling of Equipment slot : No
AMC End Date (Valid Till) :
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : The Helios 5 UC model combines the Scanning Electron Beam (SEM) and the Focused Ion Beam (FIB) in order to achieve analysis at nano-scale resolution. The instrument is equipped with different detectors, GIS systems and micromanipulator which make it ideal for to perform high-resolution imaging, nano-patterning, material deposition, milling, TEM lamella preparation etc. Thermo Fischer Scientific UltraDry EDS Detector ; 100mm² active detection area ; Norvar Window with proprietary evacuated tube design for detection sensitivity to Be ; 129eV resolution at Mn K-alpha
| Samples | External Academic User | Internal Academic User | Industry User | Start-ups |
|---|---|---|---|---|
|
SEM Imaging / EDS Analysis
|
|
|
|
|
|
TEM Lamella preparation (Mini 4 hours to be booked)
|
|
|
|
|
|
FIB Patterning (Min 2 hours to be booked)
|
|
|
|
|
|
FIB Slice & View
|
|
|
|
|
| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
|---|---|---|---|---|---|---|
| No Data Available | ||||||
Copyright © 2026 I-STEM. All rights reserved Hosted at the National Informatics Centre, Delhi, India Audited by: STQC Bengaluru as on 26 Sep 2024