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Equipment Info
Stylus Profilometer
Note: Equipment is Down.
Equipment Code : 2736842
Make : Bruker
Model : Dektak XT
Institution : Sophisticated Analytical Instrument Facilities (SAIF) IIT Bombay
Department : SAIF
Funding Agency Details : DST, Govt. of India
Pooling of Equipment slot : No
AMC End Date (Valid Till) :
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : The DektakXT stylus surface profiler is an advanced thin and thick film step height measurement tool.Stylus profilometers also use to detect the surface roughness. The DektakXT system takes measurements electromechanically by moving a diamond –tipped stylus over the sample surface according to user-programmed scan length, speed and stylus force.
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1D or 2D scan
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3D Scan(Mapping per Hour)
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