Enter the captcha to process the search!
Equipment Info
X ray Diffractometer Facility at MEMS
Equipment Code : 2745812
Make : Empyrean
Model : Empyrean
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details :
Pooling of Equipment slot : No
AMC End Date (Valid Till) :
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : x- ray Diffraction(XRD ) is a versatile non -destructive analytical technique used to analyze physical properties such as phase composition , crystal stucture and orientation of powder solid samples. Phase identication can be performed by comparing x-ray diffraction patterns obtained from unkmown samples to patterns in reference database.
| Samples | External Academic User | Internal Academic User | Industry User | Start-ups |
|---|---|---|---|---|
|
Normal theta to two theta Scan (maximum 15minutes per sample)
|
|
|
|
|
|
GI-XRD (maximum15minutes per sample)
|
|
|
|
|
|
HT-XRD (maximum15minutes per sample)
|
|
|
|
|
|
SAXS (maximum15minutes per sample)
|
|
|
|
| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
|---|---|---|---|---|---|---|
| No Data Available | ||||||
Copyright © 2026 I-STEM. All rights reserved Hosted at the National Informatics Centre, Delhi, India Audited by: STQC Bengaluru as on 26 Sep 2024