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Equipment Info
Scanning probe microscope facility II at Physics
Note: Equipment is Down.
Equipment Code : 2745962
Make : Bruker (Previously Veeco)
Model : Multimode Nanoscope IV
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details : Institution Funding (Self Supported)
Pooling of Equipment slot : No
AMC End Date (Valid Till) :
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : Scanning Probe Microscope facility is used to characterize surfaces and structure at nanoscale using variety of physical probes. The facility includes Atomic Force Microscopy (AFM), Scanning Tunneling microscope (STM) etc.
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