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Equipment Info
Conductive atomic force microscope facility
Equipment Code : 2746048
Make : Asylum/Oxford Instruments
Model : MFP3D Origin
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details : Ministry of Education or IoE Funding and DST
Pooling of Equipment slot : No
AMC End Date (Valid Till) :
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : This facility s a technique that uses a AFM tip to measure the topography of a sample surface along with its local electrical conductivity. This facility was installed in Aug 2015 and is widely used to study the electrical properties of materials like semiconductors, nanomaterials, organic electronics etc.
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