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Equipment Info
Atomic Force Microscopy Park NX20
Equipment Code : 2746207
Make : Park Systems
Model : NX20
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details : Ministry of Education
Pooling of Equipment slot : No
AMC End Date (Valid Till) :
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : The Atomic Force Microscopy (AFM) Facility is a specialized laboratory equipped for high-resolution surface characterization, nanomechanical measurements, and molecular interactions at the nanoscale. The facility supports a broad range of research applications in materials science, biology, and biophysics.Key Features and Capabilities:High-Resolution Imaging: Enables topographical mapping of surfaces with nanometer-scale resolution.Force Spectroscopy: Measures mechanical properties such as stiffness, elasticity, and adhesion forces at the molecular level.Modes of Operation: Includes contact mode, tapping mode, and non-contact mode for diverse sample analysis.Environmental Control: Options for imaging in ambient air, liquid environments, and controlled atmospheres for biological and material studies.Advanced Data Analysis: Software for quantitative analysis of surface roughness, particle size, and force-distance curves.Multi-Sample Compatibility: Capable of analyzing biological samples
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AFM (max 3Hrs slot (Max sample 3/Slot))
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