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Equipment Info
Field Emission - Scanning Electron Microscope (From DST-FIST to MME) Jeol
Equipment Code : 2947120
Make : Jeol, Japan
Model : 7610FPLUS
Institution : National Institute of Technology (NIT) Karnataka Surathkal
Department : Central Research Facility
Funding Agency Details :
Pooling of Equipment slot : No
AMC End Date (Valid Till) :
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : A Field Emission Gun (FEG) in a Scanning Electron Microscope (SEM) utilizes a sharp, single crystal tungsten tip to generate an electron beam with high brightness and coherence, resulting in improved spatial resolution and reduced sample damage.
| Samples | External Academic User | Internal Academic User | Industry User | Start-ups |
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Only Imaging
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Images + EDS 10 images + 2 regions
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EDS Mapping or Line Scan
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Images + Mapping or Line Scan (10 images + per scan)
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Images + EDS + Mapping or Line Scan
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Images + EDS + Mapping + Line Scan
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Sputtering ('Au' Coating) for non conducting samples
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| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
|---|---|---|---|---|---|---|
| No Data Available | ||||||
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