Equipment Info

Scanning Electron Microscope

Equipment Info

Equipment Code : 1721548

Make : Jeol

Model : JSM-6360

Institution : SAIF NEHU Shillong

Department : Sophisticated Analytical Instrument Facility (SAIF)

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Scanning electron microscopy (SEM) is a versatile tool for high resolution surface imaging. The SEM uses low energy secondary electrons (SEI) or high energy back scattered electrons (BEI) from the specimen surface for image formation. While SEI image provides information on 50 to 150 3Å thicknesses of the sample, BEI image reveals surface features from larger depth. The advantages of SEM over light microscopy are greater magnification, resolution and much larger depth of field.

Usage Rate: (as indicated by the custodian/host institution)

S.No.	Users Category	Rate (unit ) & (In Rupees)
1	Academic (External)*
2	Academic (Internal)***
3	Grassroot innovator
4	Industry User
5	National Research Lab User
6	Startup/MSME User

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
support@istem.co.in

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Scanning Electron Microscope

Equipment Info

Equipment Code : 1721548

Make : Jeol

Model : JSM-6360

Institution : SAIF NEHU Shillong

Department : Sophisticated Analytical Instrument Facility (SAIF)

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Scanning Electron Microscope

Equipment Info

Equipment Code : 1721548

Make : Jeol

Model : JSM-6360

Institution : SAIF NEHU Shillong

Department : Sophisticated Analytical Instrument Facility (SAIF)

Funding Agency Details :

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources