Equipment Info

Semiconductor Parameter Analyzer

Equipment Info

Equipment Code : 3226688

Make : Keysight

Model : B1500A

Institution : Indian Institute of Technology (IIT) Palakkad

Department : Central Instrumentation Facility

Funding Agency Details : Ministry of Education

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : The semiconductor parameter analyser integrates multiple measurement and analysis capabilities to perform the current?voltage (I-V) and capacitance measurements [C-V (capacitance?voltage), C?f (capacitance-frequency), and C?t (capacitance-time)] accurately.

Usage Rate: (as indicated by the custodian/host institution)

S.No.	Users Category	Rate (unit ) & (In Rupees)
1	Academic (External)*
2	Academic (Internal)***
3	Grassroot innovator
4	Industry User
5	National Research Lab User
6	Startup/MSME User

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
support@istem.co.in

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Semiconductor Parameter Analyzer

Equipment Info

Equipment Code : 3226688

Make : Keysight

Model : B1500A

Institution : Indian Institute of Technology (IIT) Palakkad

Department : Central Instrumentation Facility

Funding Agency Details : Ministry of Education

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : The semiconductor parameter analyser integrates multiple measurement and analysis capabilities to perform the current?voltage (I-V) and capacitance measurements [C-V (capacitance?voltage), C?f (capacitance-frequency), and C?t (capacitance-time)] accurately.

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Semiconductor Parameter Analyzer

Equipment Info

Equipment Code : 3226688

Make : Keysight

Model : B1500A

Institution : Indian Institute of Technology (IIT) Palakkad

Department : Central Instrumentation Facility

Funding Agency Details : Ministry of Education

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : The semiconductor parameter analyser integrates multiple measurement and analysis capabilities to perform the current?voltage (I-V) and capacitance measurements [C-V (capacitance?voltage), C?f (capacitance-frequency), and C?t (capacitance-time)] accurately.

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources