Equipment Info

Atomic Force Microscope

Equipment Info

Equipment Code : 826702

Make : Bruker Germany

Model : Multimode 8

Institution : Malaviya National Institute of Technology (MNIT) Jaipur

Department : Material Research Center

Funding Agency Details : Ministry of Education

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Multimode Scanning Microscope has all standard operating modes like SPM, AFM, MFM, LFM, TM, TR, Nanoindentation, Lithography and many unique capabilities to characterize everything from mechanical to electrical properties at high resolution.

Usage Rate: (as indicated by the custodian/host institution)

Samples	External Academic User	Internal Academic User	Industry User	Start-ups	National Research Lab User	Grassroot innovator
AFM Analysis (Imaging)

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
support@istem.co.in

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Atomic Force Microscope

Equipment Info

Equipment Code : 826702

Make : Bruker Germany

Model : Multimode 8

Institution : Malaviya National Institute of Technology (MNIT) Jaipur

Department : Material Research Center

Funding Agency Details : Ministry of Education

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Multimode Scanning Microscope has all standard operating modes like SPM, AFM, MFM, LFM, TM, TR, Nanoindentation, Lithography and many unique capabilities to characterize everything from mechanical to electrical properties at high resolution.

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Atomic Force Microscope

Equipment Info

Equipment Code : 826702

Make : Bruker Germany

Model : Multimode 8

Institution : Malaviya National Institute of Technology (MNIT) Jaipur

Department : Material Research Center

Funding Agency Details : Ministry of Education

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Multimode Scanning Microscope has all standard operating modes like SPM, AFM, MFM, LFM, TM, TR, Nanoindentation, Lithography and many unique capabilities to characterize everything from mechanical to electrical properties at high resolution.

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources