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Equipment Info
Atomic Force Microscopy (AFM)
Equipment Code : 1633605
Make : Bruker AXS Pte Ltd
Model : Multimode 8
Institution : National Institute of Technology (NIT) Agartala
Department : Central Research Facility
Funding Agency Details : Ministry of Education
Pooling of Equipment slot : No
Last AMC Done :
Description : AFM is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe.
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AFM
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Note:
i) Academic (External) means researchers belongs to the other institution.
ii) Academic (Internal but different department/lab) means researchers belongs to other department/lab or other investigators.
iii) Academic (Internal) means researchers belongs to the same institution.
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