Equipment Info

Field Emission Scanning Electron Microscope

Equipment Info

Equipment Code : 333927

Make : Jeol

Model : JEOL JSM-7610F Plus

Institution : Lovely Professional University (LPU) Jalandhar

Department : Central Instrumentation Facility CIF

Funding Agency Details : Institution Funding (Self Supported)

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  04-Aug-2022

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : The lab is equipped with FESEM coupled with EDS detector (JEOL JSM-7610F Plus and EDS: OXFORD EDS LN2 free) with Au Coater (JEOL Smart Coater). Field-emission scanning electron microscopy (FESEM) is an analytical technique used in material science to investigate molecular surface structures and their electronic properties. Microscopy techniques are used to produce real-space magnified images of a surface showing what it looks like. In general, microscopy information concerns surface crystallography (i.e. how the atoms are arranged at the surface), surface morphology (i.e. the shape and size of topographic features making the surface), and surface composition (the elements and compounds the surface is composed of).

Usage Rate: (as indicated by the custodian/host institution)


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Accessories / Consumables / Spare parts / Testing modes

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