Equipment Info

X-Ray Photoemission Spectroscopy (CRF-XPS)

Equipment Info

Equipment Code : 2042323

Make : PHI

Model : 5000 versa probe III

Institution : Indian Institute of Technology (Indian School of Mines) Dhanbad

Department : Central Research Facility

Funding Agency Details : Institution

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  

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PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Scanned, micro-focused, monochromatic X-ray beam; X-ray beam induced secondary electron imaging (SXI); Dual beam charge neutralization; 128 data channel detection; Chemical state imaging; Single Crater multi-point depth profiling; Floating column monatomic Ar ion gun; Compucentric Zalar™ rotation; Angle dependent XPS; Five axis automated sample manipulator; 25 mm and 60 mm diameter sample mount.

Usage Rate: (as indicated by the custodian/host institution)


Samples External Academic User Internal Academic User Industry User Start-ups National Research Lab User Grassroot innovator
XPS Analysis (per hour)
Depth Profile (per hour)

Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available