Equipment Info

Field Emission Scanning Electron Microscope

Equipment Info

Equipment Code : 2042787

Make : Zeiss, Germany

Model : Supra 55

Institution : Indian Institute of Technology (Indian School of Mines) Dhanbad

Department : Central Research Facility

Funding Agency Details : Institution

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  

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PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : FESEM Resolution: 0.8 nm at 15 KV, 1.6nm at 1 KV; Magnification: 12-1000000X; Acceleration voltage: 100V TO 30 KV; Gun type: Schottky Field Emission Electron Gun; Maximum Probe Current: 12 pA to 100 nA; Detectors: SE, In-Lens, BSE, Retractable STEM with Bright and dark field; EDS: Oxford Liquid Nitrogen free SDD X MAX 50 EDS; Single sensor large area (50 mm2) Silicon Drift Detector (SDD) sensor, count rates > 500,000 cps, Throughput > 200,000 cps,Resolution: @ 127eV @ MnK? EBSD:Oxford Integrated Advanced Aztec HKL EBSD with forescatter detector system with 4 diodes for Nordlys Analysis CL:Consisting Gatan Mono CL4 (wavelength ranges between 200-850nm), UVMCL (wavelength ranges between 185-200nm) & FIRMCL (wavelength ranges between 1600-2300nm); Sample Coating facilities:Carbon, Gold and Platinum-Palladium are available

Usage Rate: (as indicated by the custodian/host institution)


Samples External Academic User Internal Academic User Industry User Start-ups National Research Lab User Grassroot innovator
FESEM Imaging(per hour)
EDAX Point Analysis(per hour)
EDAX Mapping(per hour)
EBSD (per sample)
STEM (per hour)
CL (per hour)
Cathodoluminescence

Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available