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Equipment Info
| Samples | External Academic User | Internal Academic User | Industry User | Start-ups | National Research Lab User | Grassroot innovator |
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Nanoindentation(minimum 10 indent)
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Nanoindentation (With imaging) (minimum 10 indent)
This mode is Down |
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Nano-DMA test
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High temperature indentation
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Additional tests defined by the user
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Scratch Test (minimum 10 scratch)
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High load Scratch Test (minimum 10 scratch)
This mode is Down |
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Nano-DMA
This mode is Down |
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High temperature
This mode is Down |
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High Load Indentation (10mN to 10N)((minimum 10 indent))
This mode is Down |
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Scanning Image/SPM for one scanning
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| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
|---|---|---|---|---|---|---|
| No Data Available | ||||||
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