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Equipment Info
X-Ray Photoelectron spectroscopy facility
Equipment Code : 2746091
Make : Kratos Analytical
Model : Axis Supra+
Institution : Indian Institute of Technology (IIT) Bombay
Department : Centre for Sophisticated Instruments and Facilities
Funding Agency Details : Institution Funding (Self Supported)
Pooling of Equipment slot : No
AMC End Date (Valid Till) :
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : Electron spectroscopy for chemical analysis instrument is used for characterisation of surfaces and interfaces. It can provide great deal of information such as elemental composition, chemical state composition of elements present, spatial distribution of elements and their chemical state, composition as a function of depth, Central Surface Analytical Facility thickness of thin films etc.
| Samples | External Academic User | Internal Academic User | Industry User | Start-ups |
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XPS
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XPS + depth profiling or imaging
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Specialized in-situ XPS measurement (per hour of instrument usage)*
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| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
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