Enter the captcha to process the search!
Equipment Info
| Samples | External Academic User | Internal Academic User | Industry User | Start-ups | National Research Lab User | Grassroot innovator |
|---|---|---|---|---|---|---|
|
XPS(HR-XPS up to 3 elements, 2 location for thin film samples, one location per sample for powder sample )
|
|
|
|
|
||
|
HR-XPS For every additional elements
|
|
|
|
|
||
|
HR-XPS for every additional point per element
|
|
|
|
|
||
|
XPS + depth profiling or imaging
|
|
|
|
|
| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
|---|---|---|---|---|---|---|
| No Data Available | ||||||
Copyright © 2026 I-STEM. All rights reserved Hosted at the National Informatics Centre, Delhi, India Audited By: SISA Information Security Private Limited as on 18th Aug 2026