Equipment Info

Field Emission - Scanning Electron Microscope (From DST-FIST to MME) Jeol

Equipment Info

Equipment Code : 2947120

Make : Jeol, Japan

Model : 7610FPLUS

Institution : National Institute of Technology (NIT) Karnataka Surathkal

Department : Central Research Facility

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

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PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : A Field Emission Gun (FEG) in a Scanning Electron Microscope (SEM) utilizes a sharp, single crystal tungsten tip to generate an electron beam with high brightness and coherence, resulting in improved spatial resolution and reduced sample damage.

Usage Rate: (as indicated by the custodian/host institution)

Samples	External Academic User	Internal Academic User	Industry User	Start-ups	National Research Lab User	Grassroot innovator
Only Imaging
Images + EDS 10 images + 2 regions
EDS Mapping or Line Scan
Images + Mapping or Line Scan (10 images + per scan)
Images + EDS + Mapping or Line Scan
Images + EDS + Mapping + Line Scan
Sputtering ('Au' Coating) for non conducting samples

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
support@istem.co.in

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Field Emission - Scanning Electron Microscope (From DST-FIST to MME) Jeol

Equipment Info

Equipment Code : 2947120

Make : Jeol, Japan

Model : 7610FPLUS

Institution : National Institute of Technology (NIT) Karnataka Surathkal

Department : Central Research Facility

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : A Field Emission Gun (FEG) in a Scanning Electron Microscope (SEM) utilizes a sharp, single crystal tungsten tip to generate an electron beam with high brightness and coherence, resulting in improved spatial resolution and reduced sample damage.

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Field Emission - Scanning Electron Microscope (From DST-FIST to MME) Jeol

Equipment Info

Equipment Code : 2947120

Make : Jeol, Japan

Model : 7610FPLUS

Institution : National Institute of Technology (NIT) Karnataka Surathkal

Department : Central Research Facility

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : A Field Emission Gun (FEG) in a Scanning Electron Microscope (SEM) utilizes a sharp, single crystal tungsten tip to generate an electron beam with high brightness and coherence, resulting in improved spatial resolution and reduced sample damage.

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources