Enter the captcha to process the search!
Equipment Info
| Samples | External Academic User | Internal Academic User | Industry User | Start-ups | National Research Lab User | Grassroot innovator |
|---|---|---|---|---|---|---|
|
DMA Tensile test (At Room Temperature (RT))
|
|
|
|
|
|
|
|
DMA Tensile test (Low Temperature Range (-150°C to RT))
|
|
|
|
|
|
|
|
DMA Tensile Test (High Temperature Range (RT to 350°C))
|
|
|
|
|
|
|
|
DMA Tensile test (Low to High Temperature Range (-150°C to 350°C))
|
|
|
|
|
|
|
|
DMA Compression test (At Room Temperature (RT))
|
|
|
|
|
|
|
|
DMA Compression test (Low Temperature Range (-150°C to RT))
|
|
|
|
|
|
|
|
DMA Compression Test (High Temperature Range (RT to 350°C))
|
|
|
|
|
|
|
|
DMA Compression test (Low to High Temperature Range (-150°C to 350°C))
|
|
|
|
|
|
|
|
DMA Three-Point Bending Test At Room Temperature (RT)
|
|
|
|
|
|
|
|
DMA Three-Point Bending Test (Low Temperature Range (-150°C to RT))
|
|
|
|
|
|
|
|
DMA Three-Point Bending Test (High Temperature Range (RT to 350°C))
|
|
|
|
|
|
|
|
DMA Three-Point Bending Test((Low to High Temperature Range (-150°C to 350°C))
|
|
|
|
|
|
|
|
Fatigue Test [Fixed Temperature] (Tension/Compression/Three-Point Bending)(At Room Temperature (RT))
|
|
|
|
|
|
|
|
Fatigue Test [Fixed Temperature] (Tension/Compression/Three-Point Bending)(Low Temperature Range (-150°C to RT))
|
|
|
|
|
|
|
|
Fatigue Test [Fixed Temperature] (Tension/Compression/Three-Point Bending)(High Temperature Range (RT to 350°C)
|
|
|
|
|
|
|
|
Creep Test [Fixed Temperature] (Tension/Compression/Three-Point Bending)(At Room Temperature (RT))
|
|
|
|
|
|
|
|
Creep Test [Fixed Temperature] (Tension/Compression/Three-Point Bending)(Low Temperature Range (-150°C to RT))
|
|
|
|
|
|
|
|
Creep Test [Fixed Temperature] (Tension/Compression/Three-Point Bending)(High Temperature Range (RT to 350°C))
|
|
|
|
|
|
| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
|---|---|---|---|---|---|---|
| No Data Available | ||||||
Copyright © 2026 I-STEM. All rights reserved Hosted at the National Informatics Centre, Delhi, India Audited by: STQC Bengaluru as on 26 Sep 2024