Equipment Info

FE-SEM GEMINI 360

Equipment Info

Equipment Code : 2347503

Make : Carl Zeiss

Model : GEMINI 360

Institution : Indian Institute of Technology (IIT) Indore

Department : Sophisticated Instrumentation Centre A National Facility

Funding Agency Details : Institution Funding (Self Supported)

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  

1 / 1
slideshow image

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : GEMINI technology with high-efficiency in-lens detector and zero magnetic field at the specimen level Excellent resolution and image quality at both high and low operating voltages Wide operating voltage range: 0.02–30 kV User-friendly design with minimal adjustments required during condition changes Short analytical working distance (8.5 mm) enabling simultaneous high-resolution imaging and X-ray analysis High probe current (up to 100 nA) with excellent stability (<0.2%/hour) Multi-user friendly with Windows®-based SmartSEM control software Detectors Available: Backscattered Electron (BSE/BSD) Detector: Provides atomic number contrast for compositional analysis; heavier elements appear brighter, enabling effective material differentiation. Scanning Transmission Electron Microscopy (STEM) Detector: Enables transmission imaging of thin samples with nanoscale resolution, useful for studying internal microstructures, thin foils, and cross-sections.

Usage Rate: (as indicated by the custodian/host institution)


Samples External Academic User Internal Academic User Industry User Start-ups National Research Lab User Grassroot innovator
SEM
FE-SEM
EDX/EDS
BSE/BSD
aSTEM

Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available