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Equipment Info

High Resolution Field Emission Scanning Electron Microscope with EDS

Equipment Info

Equipment Code : 647902

Make : Ms JEOL ASIA PTE LTD Singapore 618494

Model : JSM7610F Plus

Institution : Guru Jambheshwar University of Science and Technology Hisar

Department : Dr APJ Abdul Kalam Central Instrumentation Laboratory

Funding Agency Details : RUSA, Govt. of India

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  

1 / 1
slideshow image

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Secondary Electron Image Resolution-0.8 nm (Accelerating voltage 15 kV) -1.0 nm (Accelerating voltage 1 kV GB mode) -0.8 nm (Accelerating voltage 1 kV GBSH mode) -During analysis: 3.0 nm (Accelerating voltage 15 kV, WD 8 mm, Probe current 5 nA) Magnification-Direct: x25 to 1,000,000 (120 x 90 mm) -Display: x75 to 3,000,000 (1,280 x 960 pixels) Accelerating Voltage-0.1 to 30 kV Probe Current-A few pA to 200 nA Electron Gun-In-lens Schottky field emission electron gun Lens System-Condenser lens (CL), Aperture-angle control lens (ACL), Semi-in lens objective lens (OL) Specimen Stage-Fully eccentric goniometer stage Specimen Movement -X: 110 mm, Y: 80 mm, Z: 1.0–40 mm, Tilt: -5° to +70°, Rotation: 360° Specimen Holders-12.5 mm diameter x 10 mm thick, 32 mm diameter x 20 mm thick Specimen Exchange-One-action exchange mechanism Electron Detector System-Upper detector, r-filter, Built-in, Lower detector Automatic Functions-Focus, Stigmator, Brightness, Contrast Image Observation LCD-Screen si

Usage Rate: (as indicated by the custodian/host institution)


Samples External Academic User Internal Academic User Industry User Start-ups National Research Lab User Grassroot innovator
FESEM with 6 images
FESEM with EDX with 6 images
FESEM with EDX+ Element Mapping with 6 images
FESEM additional per image
EDX only
EDX + Elemental mapping

Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available

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