Equipment Info

Semiconductor parameter analyzer and integrated probe station

Equipment Info

Equipment Code : 3348373

Make : Keithley 4200A-SCS Parameter Analyzer & EB-005 200 TPI

Model : 4200A-SCS PARAMETER ANALYZER PROBE STATION EVERBEING INTL CORP. Model C4

Institution : Indian Institute of Information Technology Design and Manufacturing (IIITDM) Kancheepuram

Department : Electronics And Communication Engineering

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : A

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) : No

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) : No

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : For the test measurements for diodes, rectifiers, resistors, capacitors, inductors, transistors, MOSFET, Bio-FET, memristors, memory devices, photodetectors, phototransistors, transport analysis. It can also be used for Noise Measurement, frequency-dependent measurement, and pulse measurement.

Usage Rate: (as indicated by the custodian/host institution)

Samples	External Academic User	Internal Academic User	Industry User	Start-ups	National Research Lab User	Grassroot innovator
I-V, C-V, C-f, I-t

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
support@istem.co.in

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Semiconductor parameter analyzer and integrated probe station

Equipment Info

Equipment Code : 3348373

Make : Keithley 4200A-SCS Parameter Analyzer & EB-005 200 TPI

Model : 4200A-SCS PARAMETER ANALYZER PROBE STATION EVERBEING INTL CORP. Model C4

Institution : Indian Institute of Information Technology Design and Manufacturing (IIITDM) Kancheepuram

Department : Electronics And Communication Engineering

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : A

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) : No

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) : No

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

Semiconductor parameter analyzer and integrated probe station

Equipment Info

Equipment Code : 3348373

Make : Keithley 4200A-SCS Parameter Analyzer & EB-005 200 TPI

Model : 4200A-SCS PARAMETER ANALYZER PROBE STATION EVERBEING INTL CORP. Model C4

Institution : Indian Institute of Information Technology Design and Manufacturing (IIITDM) Kancheepuram

Department : Electronics And Communication Engineering

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : A

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) : No

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) : No

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources