Equipment Info

Field Emission Scanning Electron Microscopy

Equipment Info

Equipment Code : 1950736

Make : FEI

Model : INSPECT F50

Institution : Jadavpur University Kolkata

Department : Physics

Funding Agency Details : DST, Govt. of India

Pooling of Equipment slot :   Yes

AMC End Date (Valid Till) :  

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : FESEM (INSPECT F50, FEI, The Netherlands), for morphological electron microscopy imaging with 100-100000 magnification, electron accelerating voltage of 2-30 KV. Electron Dispersive X-ray (EDX) (Bruker Nano GmBh, XFlash Detector 410-M, Bruker, Germany) for elemental spectroscopy and mapping.

Usage Rate: (as indicated by the custodian/host institution)

S.No. Users Category Rate (unit hour) & (In Rupees)
1 Academic (External)*
2 Academic (Internal)***
3 Grassroot innovator
4 Industry User
5 National Research Lab User
6 Startup/MSME User


Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available