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Equipment Info
| Samples | External Academic User | Internal Academic User | Industry User | Start-ups | National Research Lab User | Grassroot innovator |
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XPS:Survey Scan and core spectra of max. 5 elements per sample per point
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XPS:Survey Scan and core spectra for above 5 elements per sample per point (Additional charges)
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XPS: Valence band only per location per sample
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XPS:Ultraviolet photoelectron spectroscopy (UPS)
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XPS:Etching, per sample per location
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XPS:Mapping/Line scan/ Depth Profile/Angle resolved (only for THIN FILMS); per service per location
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| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
|---|---|---|---|---|---|---|
| No Data Available | ||||||
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