Equipment Info

SCANNING ELECTRON MICROSCOPE

Equipment Info

Equipment Code : 1656727

Make : FEI MICROSCOPE

Model : 9922165

Institution : National Institute of Technology (NIT) Agartala

Department : Central Research Facility

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) : 20-Nov-2025

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : A state-of-the-art field-emission scanning electron microscope, has a large sample chamber, an advanced motorized stage, navigation supported by an in-chamber camera, and an ultimate resolution of 1 nm. Detectors e.g. ETD, TLD are connected to capture secondary and backscattered electrons in a variety of settings.

Usage Rate: (as indicated by the custodian/host institution)

Samples	External Academic User	Internal Academic User	Industry User	Start-ups	National Research Lab User	Grassroot innovator
SEM image (per sample )
Gold Coating (per sample)
Per additional spot (EDS)
SEM image (per sample)+ Gold Coating
SEM image (per sample)+ Gold Coating+EDS
SEM image (per sample) + EDS

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
support@istem.co.in

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

SCANNING ELECTRON MICROSCOPE

Equipment Info

Equipment Code : 1656727

Make : FEI MICROSCOPE

Model : 9922165

Institution : National Institute of Technology (NIT) Agartala

Department : Central Research Facility

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) : 20-Nov-2025

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

SCANNING ELECTRON MICROSCOPE

Equipment Info

Equipment Code : 1656727

Make : FEI MICROSCOPE

Model : 9922165

Institution : National Institute of Technology (NIT) Agartala

Department : Central Research Facility

Funding Agency Details : Institution

Pooling of Equipment slot : No

AMC End Date (Valid Till) : 20-Nov-2025

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources