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Equipment Info
SCANNING ELECTRON MICROSCOPE
Equipment Code : 1656727
Make : FEI MICROSCOPE
Model : 9922165
Institution : National Institute of Technology (NIT) Agartala
Department : Central Research Facility
Funding Agency Details :
Pooling of Equipment slot : No
AMC End Date (Valid Till) : 20-Nov-2025
PRISM Service Category (About PRISM) : D
Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :
Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :
Equipment Certification (if any) (No document available):
Equipment Calibration (if any) (No document available):
Remarks / Special Instructions (if any):
Description : A state-of-the-art field-emission scanning electron microscope, has a large sample chamber, an advanced motorized stage, navigation supported by an in-chamber camera, and an ultimate resolution of 1 nm. Detectors e.g. ETD, TLD are connected to capture secondary and backscattered electrons in a variety of settings.
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SEM image (per sample )
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Gold Coating (per sample)
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Per additional spot (EDS)
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SEM image (per sample)+ Gold Coating
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SEM image (per sample)+ Gold Coating+EDS
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SEM image (per sample) + EDS
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| Sample Name | Sample Type | Sample UOM | Sample Availability | Unit Cost | Sample Quantity | Sample Description |
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| No Data Available | ||||||
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