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Equipment Info

Field EmissIon Gun Scanning Electron Microscope and EBSD and EDS

Equipment Info

Equipment Code : 2057496

Make : JEOL & OXFORD

Model : JSM-IT800(HL)

Institution : Indian Institute of Technology (Indian School of Mines) Dhanbad

Department : Central Research Facility

Funding Agency Details : DST and Institution

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  

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PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) : No

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) : No

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any): Cancellation & Slot Confirmation Policy: 1. Payment & Confirmation: To secure an allotted slot, the payment receipt and the duly filled, signed requisition form from the FIC must be submitted to the lab at least 3 business days prior to the scheduled date. 2. Cancellation Notice: Users wishing to cancel an allotted slot must notify the lab at least 24 hours (1 business day) in advance.

Description : FESEM JSM-IT800(HL) Gun type:In-lens Schottky field emission electron gun;FESEM Resolution: 0.7nm at 20kV,1.3nm at 1kV,3.0nm at 15kV;Magnification:17 to 2000000;Acceleration voltage:0.5 kV to 30 kV;Probe Current:4pA to 300nA;Detectors: In-lens SE,BSE (Imaging materials up to nano level);EDS Oxford Liquid Nitrogen free(Peltier-Cooled)dry SDD Xplore 30;30 mm2 SSD Sensor;Resolution: 1,000,000 cps;(for elemental composition);EBSD: Oxford CMOS based(C-Swift)EDSD Detector,Up to 622 x 512 resolution,Speeds up to 2000 PPS;(for grain size,orientation and microstructure etc).

Usage Rate: (as indicated by the custodian/host institution)


Samples External Academic User Internal Academic User Industry User Start-ups National Research Lab User Grassroot innovator
FESEM IMAGING
FESEM+EDAX POINT ANALYSIS
FESEM+EDAX MAPPING
FESEM + EBSD
FESEM+EDS+EBSD
FESEM + TKD

Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available

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