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Equipment Info

Scanning Electron Microscope (SEM)

Equipment Info

Equipment Code : 958907

Make : JEOL, Japan

Model : JSM 6490 LV

Institution : Babasaheb Bhimrao Ambedkar University Lucknow

Department : University Scientific Instrumentation Centre

Funding Agency Details : Institution Funding (Self Supported)

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  15-Oct-2025

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : A Scanning Electron Microscope (JSM 6490) scans is a focused electron beam over a surface to create an image. The electrons in the beam interact with the sample and produce various signals that is used to obtain information about the surface topography and composition. It can be use both under low & high vacuums that depending on the nature of the specimens. Low vacuum with low kV (energy) provides the user the longer duration for scanning the materials, organic specimens, before it is charged. The instrument has been coupled with an optional accessory, viz., EDS 133, EV Dry Detector (INCA x-act) of OXFORD instruments, UK, which has enhanced the application range in a manner that any metal associated with the biological material or in isolation or in the form of alloy may be identified and also quantified. The sample preparation for SEM facility has also been supported with the two important units, viz., Sputter Coater of JEOL, Japan (JFC 1600, Auto Fine Coater) and Critical Point Drye

Usage Rate: (as indicated by the custodian/host institution)


Samples External Academic User Internal Academic User Industry User Start-ups National Research Lab User Grassroot innovator
SEM without EDS
SEM with EDS

Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available

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