Equipment Info

Atomic Force Microscope

Equipment Info

Equipment Code : 298072

Make : Bruker Systems

Model : Dimension Icon

Institution : Indian Institute of Science (IISc) Bengaluru

Department : Centre for Nano Science and Engineering

Funding Agency Details : 0

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Used for mapping the topography of a sample with a max roughness on the order of a few microns. Scan range (XY): 90 um x 90 um, Scan range (Z): 13um, sample size?210 mm in dia, ?15 mm thick. Possible modes of operation: contact mode, tapping mode, Scan Asyst mode based on peak force tapping, etc., Peak Force QNM, Kelvin Probe (KPFM)/surface potential microscopy, Piezo Force Microscopy (PFM), Conductive AFM, Liquid AFM, Magnetic Force Microscopy (MFM).

Usage Rate: (as indicated by the custodian/host institution)


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