Equipment Info

Transmission Electron Microscope (TEM)

Equipment Info

Equipment Code : 298086

Make : FEI

Model : Titan Themis

Institution : Indian Institute of Science (IISc) Bengaluru

Department : Centre for Nano Science and Engineering

Funding Agency Details : 0

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Ultra-bright XFEG gun, 60-300kV, suitable for beam sensitive samples, 4K x 4K CMOS camera, single tilt and double tilt specimen holds, new computerized 5-axis specimen piezo stage, Super-X quad EDS detector for super-fast elemental analysis, EDX Solid State Detector, HRTEM and STEM modes, HAADF (High Angle Annular Dark FIeld Imaging) and Dark FIeld/ Bright Field (DF/BF) detectors for simultaneous imaging in STEM mode, SAED (selected area electron diffraction). Minimum Booking Hour Requirement -3 hours

Usage Rate: (as indicated by the custodian/host institution)


Samples External Academic User Internal Academic User Industry User Start-ups National Research Lab User Grassroot innovator
Default Analysis

Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available