Equipment Info

X-Ray Photoelectron Spectroscopy (XPS)

Equipment Info

Equipment Code : 198626

Make : M/S. Physical Electronics, USA

Model : PHI 5000 VERSAPROBE - II

Institution : CSIR Central Glass and Ceramic Research Institute (CGCRI) Kolkata

Department : Multiscale Microstructure and Mechanics of Materials

Funding Agency Details : CSIR, Govt. of India

Pooling of Equipment slot : Yes

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Energy Resolution : 0.6 eV; Spatial Resolution : 7.5 um; Detection limit : 0.1- 0.5 Atomic %; Escape depth : 0.5- 7.5 nm; Probe size : 10 um;

Usage Rate: (as indicated by the custodian/host institution)

Samples	External Academic User	Internal Academic User	Industry User	Start-ups	National Research Lab User	Grassroot innovator
Study the materials interaction at atomic level by using XPS/UPS

Accessories / Consumables / Spare parts / Testing modes

Sample Name	Sample Type	Sample UOM	Sample Availability	Unit Cost	Sample Quantity	Sample Description
No Data Available

The Indian Science, Technology, and Engineering facilities Map (I-STEM) is an interactive web portal designed to accelerate scientific progress in India. This initiative, conceived and supported by the Office of the Principal Scientific Adviser to the Government of India, creates a centralized platform for sharing publicly funded R&D equipment and facilities across various institutions throughout the country.

Resources

18004253281 (customer care)
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Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

X-Ray Photoelectron Spectroscopy (XPS)

Equipment Info

Equipment Code : 198626

Make : M/S. Physical Electronics, USA

Model : PHI 5000 VERSAPROBE - II

Institution : CSIR Central Glass and Ceramic Research Institute (CGCRI) Kolkata

Department : Multiscale Microstructure and Mechanics of Materials

Funding Agency Details : CSIR, Govt. of India

Pooling of Equipment slot : Yes

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Energy Resolution : 0.6 eV; Spatial Resolution : 7.5 um; Detection limit : 0.1- 0.5 Atomic %; Escape depth : 0.5- 7.5 nm; Probe size : 10 um;

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Resources

Indian Science Technology and Engineering facilities Map

Indian Science Technology and Engineering facilities Map

X-Ray Photoelectron Spectroscopy (XPS)

Equipment Info

Equipment Code : 198626

Make : M/S. Physical Electronics, USA

Model : PHI 5000 VERSAPROBE - II

Institution : CSIR Central Glass and Ceramic Research Institute (CGCRI) Kolkata

Department : Multiscale Microstructure and Mechanics of Materials

Funding Agency Details : CSIR, Govt. of India

Pooling of Equipment slot : Yes

AMC End Date (Valid Till) :

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : Energy Resolution : 0.6 eV; Spatial Resolution : 7.5 um; Detection limit : 0.1- 0.5 Atomic %; Escape depth : 0.5- 7.5 nm; Probe size : 10 um;

Usage Rate: (as indicated by the custodian/host institution)

Accessories / Consumables / Spare parts / Testing modes

Acknowledgement Statement For Equipment users:

Acknowledgement Statement For Equipment users:

Resources