Equipment Info

Scanning Electron Microscope

Equipment Info

Equipment Code : 328748

Make : JEOL Japan

Model : JSM - 5600LV

Institution : CSIR National Institute for Interdisciplinary Science and Technology (NIIST) Thiruvananthapuram

Department :

Funding Agency Details : 0

Pooling of Equipment slot :   No

AMC End Date (Valid Till) :  

PRISM Service Category (About PRISM) : D

Pre-Experiment Support (including sample preparation, setup assistance and pre-experimental guidance) :

Post-Experiment Support (including result interpretation, data analysis and post-experimental reporting) :

Equipment Certification (if any) (No document available):

Equipment Calibration (if any) (No document available):

Remarks / Special Instructions (if any):

Description : The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition. In most applications, data are collected over a selected area of the surface of the sample, and a 2-dimensional image is generated that displays the morphology of the sample Resolution (SEI) : 3.5nm (Acc30KV,WD6mm : depends on sample) Magnification : 18X (WD48mm) to 300000X (depends on sample) Image mode : SEI (Secondary Electron Image) Probe current range: ?10?^(-12) to ?10?^(-6) A Acceleration voltage: 0.5 to 30kV Filament :Precentered W hairpin filament

Usage Rate: (as indicated by the custodian/host institution)

S.No. Users Category Rate (unit hour) & (In Rupees)
1 Academic (External)*
2 Academic (Internal)***
3 Grassroot innovator
4 Industry User
5 National Research Lab User
6 Startup/MSME User


Accessories / Consumables / Spare parts / Testing modes

Sample Name Sample Type Sample UOM Sample Availability Unit Cost Sample Quantity Sample Description
No Data Available